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Defect Spectrum: A Granular Look of Large-Scale Defect Datasets with Rich Semantics (2310.17316v5)

Published 26 Oct 2023 in cs.CV

Abstract: Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

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Authors (7)
  1. Shuai Yang (140 papers)
  2. Zhifei Chen (6 papers)
  3. Pengguang Chen (20 papers)
  4. Xi Fang (26 papers)
  5. Shu Liu (146 papers)
  6. Yingcong Chen (35 papers)
  7. Yixun Liang (18 papers)
Citations (5)

Summary

  • The paper introduces a refined annotation process that enhances semantic richness by reclassifying defects in datasets like MVTec, VISION, DAGM, and COTTON.
  • The paper employs the Defect-Gen approach with diffusion models to generate diverse synthetic defect images, validated with FID and LPIPS metrics.
  • The paper demonstrates significant segmentation performance improvements over baselines, underscoring its potential for advancing automated quality assurance.

An Analytical Overview of "Defect Spectrum: A Granular Look of Large-Scale Defect Datasets with Rich Semantics"

The paper "Defect Spectrum: A Granular Look of Large-Scale Defect Datasets with Rich Semantics" delivers an in-depth exploration into the precise annotation and generation of large-scale defect datasets, significantly enhancing the semantic richness and granularity of existing datasets. This paper targets the improvement of defect annotations and the generation of diverse defects, leveraging diffusion models to bolster the diversity and fidelity of synthetic defect images.

Annotation Enhancements

One critical contribution of this paper is the refined annotation process for defect datasets, such as MVTec, VISION, DAGM, and COTTON. The paper presents an exhaustive comparison between existing annotations and the improved ones, emphasizing their enhanced semantic richness. For instance, the authors have systematically reclassified the MVTec dataset defects based on defect type, thereby enhancing the semantic granularity. In datasets lacking pixel-level annotations, such as DAGM and COTTON, the authors introduce new, meticulously detailed annotations.

Defect Generation with Diffusion Models

The paper describes a novel approach named Defect-Gen for generating defect images, employing a diffusion model with both large and small receptive fields. Extensive quantitative evaluations were conducted to compare the fidelity and diversity of generated images, using Fréchet Inception Distance (FID) and Learned Perceptual Image Patch Similarity (LPIPS) scores as metrics. Notably, the paper validates that increasing the switch timestep (uu) enhances fidelity at the cost of diversity, establishing empirical settings for optimal performance.

Quantitative Evaluation and Performance Metrics

In evaluating segmentation performance, the paper presents convincing numerical results where their method outperforms baseline approaches, such as sinDiffusion and DDPM, on the MVTec dataset across various classes. Notably, their technique yields a mean improvement in segmentation performance, with marked results in specific classes such as "capsule" and "metal_nut."

Implications and Future Directions

The implications of this research are profound for both practical application and theoretical advancement in defect detection and quality assurance systems. The heightened annotation precision and diverse, high-fidelity synthetic data can significantly improve model training, leading to more robust industrial inspection algorithms. The authors' findings could also prompt further exploration into diffusion models in other domains beyond defect detection.

Furthermore, the methodologies introduced for defect annotation and generation could stimulate advancements in automated quality control processes, potentially influencing the development of adaptive learning systems that self-improve with new data inputs. Continued research could explore refining the balance between fidelity and diversity further or extending the framework for use in real-time applications.

In summary, the paper provides a comprehensive methodology for augmenting defect datasets, combining rigorous annotation with state-of-the-art generation techniques. As the field progresses, such robust approaches will likely form the backbone of next-generation artificial intelligence systems in industrial inspection and other facets of automated quality assurance.

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