Emergent Mind

Abstract

We study over-parameterized classifiers where Empirical Risk Minimization (ERM) for learning leads to zero training error. In these over-parameterized settings there are many global minima with zero training error, some of which generalize better than others. We show that under certain conditions the fraction of "bad" global minima with a true error larger than {\epsilon} decays to zero exponentially fast with the number of training data n. The bound depends on the distribution of the true error over the set of classifier functions used for the given classification problem, and does not necessarily depend on the size or complexity (e.g. the number of parameters) of the classifier function set. This insight may provide a novel perspective on the unexpectedly good generalization even of highly over-parameterized neural networks. We substantiate our theoretical findings through experiments on synthetic data and a subset of MNIST. Additionally, we assess our hypothesis using VGG19 and ResNet18 on a subset of Caltech101.

We're not able to analyze this paper right now due to high demand.

Please check back later (sorry!).

Generate a summary of this paper on our Pro plan:

We ran into a problem analyzing this paper.

Newsletter

Get summaries of trending comp sci papers delivered straight to your inbox:

Unsubscribe anytime.