Learning Deep Optimal Embeddings with Sinkhorn Divergences (2209.06469v1)

Abstract: Deep Metric Learning algorithms aim to learn an efficient embedding space to preserve the similarity relationships among the input data. Whilst these algorithms have achieved significant performance gains across a wide plethora of tasks, they have also failed to consider and increase comprehensive similarity constraints; thus learning a sub-optimal metric in the embedding space. Moreover, up until now; there have been few studies with respect to their performance in the presence of noisy labels. Here, we address the concern of learning a discriminative deep embedding space by designing a novel, yet effective Deep Class-wise Discrepancy Loss (DCDL) function that segregates the underlying similarity distributions (thus introducing class-wise discrepancy) of the embedding points between each and every class. Our empirical results across three standard image classification datasets and two fine-grained image recognition datasets in the presence and absence of noise clearly demonstrate the need for incorporating such class-wise similarity relationships along with traditional algorithms while learning a discriminative embedding space.